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125/156mm Mono-crystalline Wafer Specification
Dimension
125 mm
156 mm
Growth Method
CZ
CZ
Conductive Type
P
P
Dopant
B
B
Orientation
<100>
<100>
Off Orientation
<±2°
<±2°
Resistivity
1 –3 Ω•cm
1 –3 Ω•cm
Bulk Lifetime
≥10μs
≥10μs
Oxygen Content
≤1.0*1018 /cm3
≤1.0*1018 /cm3
Carbon Content
≤5.0*1016 /cm3
≤5.0*1016 /cm3
Dimension
125*125±0.5mm
156*156±0.5mm
Diagonal
150±0.5mm
200±0.5mm
Square Sides Angle
90±0.3°
90±0.3°
Streight Sections Length Deviation
29.76±1.0mm
21.81±1.0mm
Thickness
200±20 μm(thinnest≥180μm)
200±20 μm(thinnest≥180μm)
TTV
≤30μm
≤30μm
Saw Mark
≤15μm
≤15μm
Warp
≤50μm
≤50μm
Chips
Depth<0.3mm;Length<0.5mm
less than 2pcs
Depth<0.3mm;Length<0.5mm,
less than 2pcs
Appearance
No Stain, No Pinhole and Cracks byVisual Inspection
No Stain, No Pinhole and Cracks byVisual Inspection
Dislocation Density
≤3000 pcs/cm2
≤3000 pcs/cm2
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